Synthesis and characterization of atomically-thin graphite films on a

Oct 2, 2006 - with scanning electron microscopy data, as well as with previous studies. ... 1: (a-d) LEED patterns with a primary energy of 180eV, obt...

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NTT Basic Research Laboratories, NTT Corporation, Atsugi, Kanagawa 243-0198, Japan. Low-energy electron microscopy ... The dip positions are well explained using tight-binding and first-principles calculations. The graphite thickness .... data from t

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Jun 2, 2016 - der XRD patterns and single crystal XRD diffraction peaks, respectively. The asterisks in panel (a) mark ... tion (XRD) at room temperature using a Rigaku diffrac- tometer with Cu Kα radiation and a graphite ... RESULTS. The schematic